Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

MONOX: un nouveau spectrogoniomètre pour le rayonnement X mou et X-UV

J.-M. André, A. Avila, R. Barchewitz, R. Benbalagh, R. Delaunay, D. Druart, M.-F. Fontaine, H. Ringuenet

J. Phys. IV France, 118 (2004) 173-181

DOI: https://doi.org/10.1051/jp4:2004118021

PDF (89.34 KB)

This article has been cited by the following article(s):

A compact low cost “master–slave” double crystal monochromator for x-ray cameras calibration of the Laser MégaJoule Facility

S. Hubert and V. Prévot
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 768 186 (2014)
https://doi.org/10.1016/j.nima.2014.09.045

Interface characteristics of Mo/Si and B4C/Mo/Si multilayers using non-destructive X-ray techniques

H. Maury, P. Jonnard, J.-M. André, et al.
Surface Science 601 (11) 2315 (2007)
https://doi.org/10.1016/j.susc.2007.03.044

Non-destructive X-ray study of the interphases in Mo/Si and Mo/B4C/Si/B4C multilayers

H. Maury, P. Jonnard, J.-M. André, et al.
Thin Solid Films 514 (1-2) 278 (2006)
https://doi.org/10.1016/j.tsf.2006.02.073

Physico‐chemical study of the interfaces of Mo/Si multilayer interferential mirrors: correlation with the optical properties

H. Maury, J.‐M. André, J. Gautier, et al.
Surface and Interface Analysis 38 (4) 744 (2006)
https://doi.org/10.1002/sia.2248

Lamellar multilayer amplitude grating as soft-X-ray Bragg monochromator

Rabah Benbalagh, Jean-Michel André, Robert Barchewitz, et al.
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 541 (3) 590 (2005)
https://doi.org/10.1016/j.nima.2004.12.015

Physico-chemical and X-ray optical characterizations of a Mo/Si multilayer interferential mirror upon annealing

P. Jonnard, I. Jarrige, R. Benbalagh, et al.
Surface Science 589 (1-3) 164 (2005)
https://doi.org/10.1016/j.susc.2005.05.058