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Cited article:

Spontaneous soft x-ray fluorescence from a superlattice under Kossel diffraction conditions

P Jonnard, Y-Y Yuan, K Le Guen, et al.
Journal of Physics B: Atomic, Molecular and Optical Physics 47 (16) 165601 (2014)
https://doi.org/10.1088/0953-4075/47/16/165601

Interface characteristics of Mo/Si and B4C/Mo/Si multilayers using non-destructive X-ray techniques

H. Maury, P. Jonnard, J.-M. André, et al.
Surface Science 601 (11) 2315 (2007)
https://doi.org/10.1016/j.susc.2007.03.044