Articles citing this article

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Cited article:

Influence of Crystallographic Orientation on Creep Resistance of Single-Crystal Superalloy

Barbara Kościelniak, Kamil Gancarczyk, Marek Poręba and Robert Albrecht
Advances in Manufacturing Science and Technology 44 (3) 93 (2020)
https://doi.org/10.2478/amst-2019-0017

Omega-Scan: an X-ray tool for the characterization of crystal properties

Hans Berger, Hans-Arthur Bradaczek and Hans Bradaczek
Journal of Materials Science: Materials in Electronics 19 (S1) 351 (2008)
https://doi.org/10.1007/s10854-007-9479-y