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Cited article:
H. Takano , K. Uesugi , A. Takeuchi , K. Takai , Y. Suzuki
J. Phys. IV France, 104 (2003) 41-44
This article has been cited by the following article(s):
11 articles
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Atsushi Momose, Ryosuke Ueda, Mingjian Cai, Zhuoxuan Zhao, Sam Kalirai, Maderych Stan, Jeff Irwin, Hiroki Kawakami, Pouria Zangi, Pascal Meyer, Martin Börner, Joachim Schulz, Bert Müller and Ge Wang 35 (2022) https://doi.org/10.1117/12.2636393
Analysis of Hair Structure and Imaging of Damaged Hair by Using X-ray
Kouji Takehara Journal of Society of Cosmetic Chemists of Japan 49 (3) 197 (2015) https://doi.org/10.5107/sccj.49.197
The Internal Structure of Hair Observed Using a Differential Phase Contrast Scanning X-Ray Microscope
Takafumi Inoue, Kouji Takehara, Kenji Kizawa, et al. Journal of Society of Cosmetic Chemists of Japan 46 (2) 101 (2014) https://doi.org/10.5107/sccj.46.101
Three-dimensional phase-contrast X-ray microtomography with scanning–imaging X-ray microscope optics
Akihisa Takeuchi, Kentaro Uesugi and Yoshio Suzuki Journal of Synchrotron Radiation 20 (5) 793 (2013) https://doi.org/10.1107/S0909049513018876
Simple Scanning Phase-Contrast X-ray Tomography Using Intensity Detectors
Hidekazu Takano, Sho Shimomura, Shigeki Konishi, et al. Japanese Journal of Applied Physics 52 (4R) 040204 (2013) https://doi.org/10.7567/JJAP.52.040204
Performance Test and Evaluation of Multilevel Fresnel Zone Plate with Three-Step Profile Fabricated with Electron-Beam Lithography
Akihisa Takeuchi, Yoshio Suzuki, Kentaro Uesugi, Ikuo Okada and Hiroki Iriguchi Japanese Journal of Applied Physics 51 022502 (2012) https://doi.org/10.1143/JJAP.51.022502
Differential phase contrast x-ray microimaging with scanning-imaging x-ray microscope optics
Akihisa Takeuchi, Yoshio Suzuki and Kentaro Uesugi Review of Scientific Instruments 83 (8) (2012) https://doi.org/10.1063/1.4739761
Performance Test and Evaluation of Multilevel Fresnel Zone Plate with Three-Step Profile Fabricated with Electron-Beam Lithography
Akihisa Takeuchi, Yoshio Suzuki, Kentaro Uesugi, Ikuo Okada and Hiroki Iriguchi Japanese Journal of Applied Physics 51 (2R) 022502 (2012) https://doi.org/10.7567/JJAP.51.022502
Scanning hard x-ray differential phase contrast imaging with a double wedge absorber
Taihei Mukaide, Kazuhiro Takada, Masatoshi Watanabe, Takashi Noma and Atsuo Iida Review of Scientific Instruments 80 (3) (2009) https://doi.org/10.1063/1.3095440
Tomographic quantitative phase measurement by hard X-ray micro-interferometer with 250 nm spatial resolution
Takahisa Koyama, Hidekazu Takano, Yoshiyuki Tsusaka and Yasushi Kagoshima Spectrochimica Acta Part B: Atomic Spectroscopy 62 (6-7) 603 (2007) https://doi.org/10.1016/j.sab.2007.02.021