Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

Atsushi Momose, Zhuoxuan Zhao, Ryosuke Ueda, Mingjian Cai, Hidekazu Takano, Yanlin Wu, Katsumasa Ikematsu, Hiroki Kawakami, Pouria Zangi, Pascal Meyer, Martin Börner and Joachim Schulz
2990 030003 (2023)
https://doi.org/10.1063/5.0168794

Atsushi Momose, Ryosuke Ueda, Mingjian Cai, Zhuoxuan Zhao, Sam Kalirai, Maderych Stan, Jeff Irwin, Hiroki Kawakami, Pouria Zangi, Pascal Meyer, Martin Börner, Joachim Schulz, Bert Müller and Ge Wang
35 (2022)
https://doi.org/10.1117/12.2636393

Analysis of Hair Structure and Imaging of Damaged Hair by Using X-ray

Kouji Takehara
Journal of Society of Cosmetic Chemists of Japan 49 (3) 197 (2015)
https://doi.org/10.5107/sccj.49.197

The Internal Structure of Hair Observed Using a Differential Phase Contrast Scanning X-Ray Microscope

Takafumi Inoue, Kouji Takehara, Kenji Kizawa, et al.
Journal of Society of Cosmetic Chemists of Japan 46 (2) 101 (2014)
https://doi.org/10.5107/sccj.46.101

Three-dimensional phase-contrast X-ray microtomography with scanning–imaging X-ray microscope optics

Akihisa Takeuchi, Kentaro Uesugi and Yoshio Suzuki
Journal of Synchrotron Radiation 20 (5) 793 (2013)
https://doi.org/10.1107/S0909049513018876

Simple Scanning Phase-Contrast X-ray Tomography Using Intensity Detectors

Hidekazu Takano, Sho Shimomura, Shigeki Konishi, et al.
Japanese Journal of Applied Physics 52 (4R) 040204 (2013)
https://doi.org/10.7567/JJAP.52.040204

Performance Test and Evaluation of Multilevel Fresnel Zone Plate with Three-Step Profile Fabricated with Electron-Beam Lithography

Akihisa Takeuchi, Yoshio Suzuki, Kentaro Uesugi, Ikuo Okada and Hiroki Iriguchi
Japanese Journal of Applied Physics 51 022502 (2012)
https://doi.org/10.1143/JJAP.51.022502

Differential phase contrast x-ray microimaging with scanning-imaging x-ray microscope optics

Akihisa Takeuchi, Yoshio Suzuki and Kentaro Uesugi
Review of Scientific Instruments 83 (8) (2012)
https://doi.org/10.1063/1.4739761

Performance Test and Evaluation of Multilevel Fresnel Zone Plate with Three-Step Profile Fabricated with Electron-Beam Lithography

Akihisa Takeuchi, Yoshio Suzuki, Kentaro Uesugi, Ikuo Okada and Hiroki Iriguchi
Japanese Journal of Applied Physics 51 (2R) 022502 (2012)
https://doi.org/10.7567/JJAP.51.022502

Scanning hard x-ray differential phase contrast imaging with a double wedge absorber

Taihei Mukaide, Kazuhiro Takada, Masatoshi Watanabe, Takashi Noma and Atsuo Iida
Review of Scientific Instruments 80 (3) (2009)
https://doi.org/10.1063/1.3095440

Tomographic quantitative phase measurement by hard X-ray micro-interferometer with 250 nm spatial resolution

Takahisa Koyama, Hidekazu Takano, Yoshiyuki Tsusaka and Yasushi Kagoshima
Spectrochimica Acta Part B: Atomic Spectroscopy 62 (6-7) 603 (2007)
https://doi.org/10.1016/j.sab.2007.02.021