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Cited article:

Secondary ion mass spectrometry and X‐ray photoelectron spectroscopy investigation on chemical vapor deposited CeO2ZrO2TiO2 thin films

Simona Barison, Davide Barreca, Giovanni A. Battiston, et al.
Rapid Communications in Mass Spectrometry 17 (9) 996 (2003)
https://doi.org/10.1002/rcm.1014

Nucleation and Growth of Nanophasic CeO2 Thin Films by Plasma‐Enhanced CVD

D. Barreca, A. Gasparotto, E. Tondello, et al.
Chemical Vapor Deposition 9 (4) 199 (2003)
https://doi.org/10.1002/cvde.200306247