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Cited article:

Characterization of Tin(IV) Oxide Thin Films Prepared by Atmospheric Pressure Chemical Vapor Deposition of cis‐[SnCl4{OC(H)OC2H5}2]

Nari N. Talaty, Kristina Beck, Helene Citeau, Kristin Kirschbaum and Dean M. Giolando
Zeitschrift für anorganische und allgemeine Chemie 635 (1) 53 (2009)
https://doi.org/10.1002/zaac.200800394

Development of NiO-based thin film structures as efficient H2 gas sensors operating at room temperatures

Nikos Brilis, Chara Foukaraki, Eleftherios Bourithis, et al.
Thin Solid Films 515 (24) 8484 (2007)
https://doi.org/10.1016/j.tsf.2007.03.147

An Experimentally Assisted Computational Analysis of Tin Oxide Deposition in a Cold-Wall APCVD Reactor

T. C. Xenidou, A. G. Boudouvis, D. M. Tsamakis and N. C. Markatos
Journal of The Electrochemical Society 151 (12) C757 (2004)
https://doi.org/10.1149/1.1809592