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Cited article:

Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast X-ray diffraction

K. Sokolowski-Tinten, M. Horn von Hoegen, D. von der Linde, A. Cavalleri, C.W. Siders, F.L.H. Brown, D.M. Leitner, Cs. Tóth, J.A. Squier, C.P.J. Barty

J. Phys. IV France, 11 PR2 (2001) Pr2-473-Pr2-477

DOI: https://doi.org/10.1051/jp4:2001290

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This article has been cited by the following article(s):

Thermal stresses in the reflective x-ray optics for the Linac Coherent Light Source

D. D. Ryutov
Review of Scientific Instruments 74 (8) 3722 (2003)
https://doi.org/10.1063/1.1590747