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Cited article:

The prospects of reflectometry and ellipsometry with Colorado State University tabletop XUV laser

I.A. Artioukov, B.R. Benware, R.M. Fechtchenko, J.J. Roca, M. Seminario, A.V. Vinogradov, M. Yamamoto

J. Phys. IV France, 11 PR2 (2001) Pr2-451-Pr2-457

DOI: https://doi.org/10.1051/jp4:2001287

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This article has been cited by the following article(s):

Reactive diffusion in Sc/Si multilayer X-ray mirrors with CrB2 barrier layers

Y. P. Pershyn, E. N. Zubarev, V. V. Kondratenko, V. A. Sevryukova and S. V. Kurbatova
Applied Physics A 103 (4) 1021 (2011)
https://doi.org/10.1007/s00339-011-6384-2