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Cited article:

Application of HRTEM to studies of electronic structure and atomic configuration of interface in SiC/SiC composites

T. Shibayama, G.W. He, Heishichiro Takahashi, A. Kohyama

J. Phys. IV France, 10 PR6 (2000) Pr6-97-Pr6-103

DOI: https://doi.org/10.1051/jp4:2000617

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This article has been cited by the following article(s):

Materials Issues for Generation IV Systems

C. Cabet
NATO Science for Peace and Security Series B: Physics and Biophysics, Materials Issues for Generation IV Systems 351 (2008)
https://doi.org/10.1007/978-1-4020-8422-5_18