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Cited article:

A PE-MOCVD route to V₂O₅ nanostructured thin films

D. Barreca, G.A. Battiston, F. Caccavalec, V. di Noto, R. Gerbasi, A. Gregori, G.A. Rizzi, A. Tiziani, E. Tondello

J. Phys. IV France, 09 PR8 (1999) Pr8-529-Pr8-536

DOI: https://doi.org/10.1051/jp4:1999866

PDF (1.138 MB)

This article has been cited by the following article(s):

Thin V2O5 films synthesized by plasma-enhanced atomic layer deposition for memristive applications

Irina V. Antonova, Vladimir A. Seleznev, Nadezhda A. Nebogatikova, Artem I. Ivanov, Bogdan V. Voloshin, Vladimir A. Volodin and Irina I. Kurkina
Physical Chemistry Chemical Physics 25 (46) 32132 (2023)
https://doi.org/10.1039/D3CP03761D

Dielectric function of V[sub 2]O[sub 5] nanocrystalline films by spectroscopic ellipsometry: Characterization of microstructure

Maria Losurdo, Giovanni Bruno, Davide Barreca and Eugenio Tondello
Applied Physics Letters 77 (8) 1129 (2000)
https://doi.org/10.1063/1.1289658