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Cited article:

Optical properties of silicon thin films related to LPCVD growth condition

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Thin Solid Films 450 (1) 105 (2004)
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Silicon nano-asperities: Morphological evolution and electrical properties of double-polysilicon interlayers

R. Edrei, E. N. Shauly, Y. Roizin, et al.
Journal of Electronic Materials 33 (7) 819 (2004)
https://doi.org/10.1007/s11664-004-0248-x

Atomic force microscopy investigation ofa-C:H films prepared by plasma enhanced chemical vapor deposition for inertial confinement fusion experiments

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Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 20 (2) 366 (2002)
https://doi.org/10.1116/1.1446444

Microstructural information from optical properties of LPCVD silicon films annealed at low temperature

M. Gartner, M. Modreanu, C. Cobianu, R. Gavrila and M. Danila
Sensors and Actuators A: Physical 99 (1-2) 160 (2002)
https://doi.org/10.1016/S0924-4247(01)00909-8