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Cited article:
S. Hoffmann , R. Waser
J. Phys. IV France, 08 PR9 (1998) Pr9-221-Pr9-224
This article has been cited by the following article(s):
10 articles
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Film-thickness-dependent Curie-Weiss behavior of (Ba,Sr)TiO3 thin-film capacitors having Pt electrodes
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High-K BST films deposited on MgO by PLD with and without buffer-layer
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Dielectric, infrared, and Raman response of undoped SrTiO_{3} ceramics: Evidence of polar grain boundaries
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Effects of domain formation on the dielectric properties of ferroelectric thin films
N. A. Pertsev, V. G. Koukhar, R. Waser and S. Hoffmann Integrated Ferroelectrics 32 (1-4) 235 (2001) https://doi.org/10.1080/10584580108215694
Polar grain boundaries in undoped SrTiO3 ceramics
J. Petzelt, I. Gregora, I. Rychetský, et al. Journal of the European Ceramic Society 21 (15) 2681 (2001) https://doi.org/10.1016/S0955-2219(01)00345-4
Curie–Weiss-type law for the strain and stress effects on the dielectric response of ferroelectric thin films
N. A. Pertsev, V. G. Koukhar, R. Waser and S. Hoffmann Applied Physics Letters 77 (16) 2596 (2000) https://doi.org/10.1063/1.1318934
Functional graded high-K (Ba1−xSrx)TiO3 thin films for capacitor structures with low temperature coefficient
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Ferroelectric thin films grown on tensile substrates: Renormalization of the Curie–Weiss law and apparent absence of ferroelectricity
N. A. Pertsev, A. G. Zembilgotov, S. Hoffmann, R. Waser and A. K. Tagantsev Journal of Applied Physics 85 (3) 1698 (1999) https://doi.org/10.1063/1.369338