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Cited article:

Influence of layer interface parameters on dielectric characteristics of BSTO ferroelectric film planar capacitors

A.I. Dedyk, S.F. Karmanenko, S. Leppavuori, V.I. Sakharov, A.A. Semenov, I.T. Serenkov, L.T. Ter-Martirosyan, A. Uusimak, F. Wang

J. Phys. IV France, 08 PR9 (1998) Pr9-217-Pr9-220

DOI: https://doi.org/10.1051/jp4:1998941

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This article has been cited by the following article(s):

Ferroelectric Memories

James F. Scott
Springer Series in Advanced Microelectronics, Ferroelectric Memories 3 165 (2000)
https://doi.org/10.1007/978-3-662-04307-3_11

Component composition and strain of barium-strontium titanate ferroelectric films

S. F. Karmanenko, A. I. Dedyk, N. N. Isakov, et al.
Technical Physics Letters 25 (10) 780 (1999)
https://doi.org/10.1134/1.1262633