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Cited article:

Caractérisation structurale et contraintes résiduelles de films d'AIN par diffraction des rayons X

C. Meneau, Ph. Goudeau, P. Andreazza, C. Andreazza-Vignolle, J.C. Pommier

J. Phys. IV France, 08 PR5 (1998) Pr5-153-Pr5-161

DOI: https://doi.org/10.1051/jp4:1998520

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This article has been cited by the following article(s):

X-ray diffraction analyses of titanium coatings produced by electron beam evaporation in neon and argon inert gases

J. C. Avelar-Batista, A. D. Wilson, A. Davison, A. Matthews and K. S. Fancey
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 21 (5) 1702 (2003)
https://doi.org/10.1116/1.1597893