Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

Temperature dependence of hot-carrier effects in 0.2 µm N- and P-channel fully-depleted Unibond MOSFETs

S.H. Renn, C. Raynaud, F. Balestra

J. Phys. IV France, 08 PR3 (1998) Pr3-13-Pr3-16

DOI: https://doi.org/10.1051/jp4:1998303

PDF (189.9 KB)

This article has been cited by the following article(s):

Progress in SOI Structures and Devices Operating at Extreme Conditions

V. S. Lysenko, I. P. Tyagulski, I. N. Osiyuk and Y. V. Gomeniuk
Progress in SOI Structures and Devices Operating at Extreme Conditions 159 (2002)
https://doi.org/10.1007/978-94-010-0339-1_11