Articles citing this article

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Cited article:

The use of synchrotron radiation techniques in the characterization of strained semiconductor heterostructures and thin films

C. Lamberti
Surface Science Reports 53 (1-5) 1 (2004)
https://doi.org/10.1016/j.surfrep.2003.12.001

Diffraction-anomalous-fine-structure spectroscopy applied to the study of III-V strained semiconductors

M. Proietti, H. Renevier, J. Hodeau, et al.
Physical Review B 59 (8) 5479 (1999)
https://doi.org/10.1103/PhysRevB.59.5479