Nouvelles applications de la spectrométrie d'émission X induite par excitation électronique de basse énergie (LEEIXS) en analyse de surface
J. Phys. IV France, 06 C4 (1996) C4-467-C4-474
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LEEIXS and XPS studies of reactive unbalanced magnetron sputtered chromium oxynitride thin films with air
Saı̈d Agouram, Franz Bodart and Guy TerwagneJournal of Electron Spectroscopy and Related Phenomena 134 (2-3) 173 (2004)
https://doi.org/10.1016/j.elspec.2003.10.004