Articles citing this article

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Cited article:

Réflectométrie X et diffusion aux petits angles

B. Pardo, F. Bridou, M. Maaza

J. Phys. IV France, 06 C4 (1996) C4-351-C4-366

DOI: https://doi.org/10.1051/jp4:1996432

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Growth of carbon/nickel multilayer for X-ray–UV optics by RF reactive magnetron sputtering

G Georgescu, V Nelea, M Ulmeanu, C Ghica and N Nastase
Applied Surface Science 148 (3-4) 142 (1999)
https://doi.org/10.1016/S0169-4332(99)00219-6