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Cited article:

Nouvel appareillage de diffraction X pour l'analyse de l'état mécanique (contraintes et microdéformations) de films minces nanocristallins

Ph. Goudeau, K.F. Badawi, A. Naudon, M. Jaulin, N. Durand, L. Bimbault, V. Branger

J. Phys. IV France, 06 C4 (1996) C4-187-C4-196

DOI: https://doi.org/10.1051/jp4:1996417

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This article has been cited by the following article(s):

X-ray diffraction study of residual stresses and microstructure in tungsten thin films sputter deposited on polyimide

P. Villain, P. Goudeau, J. Ligot, et al.
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 21 (4) 967 (2003)
https://doi.org/10.1116/1.1578655