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Cited article:

Fabrication and Characterization of Single-Electron Transistors Based on Al/AlO_x/Al and Nb/AlO_x/Nb Tunnel Junctions

K. Blüthner, M. Götz, W. Krech, H. Mühlig, Th. Wagner, H.-J. Fuchs, D. Schelle, L. Fritzsch, B. Nachtmann, A. Nowack

J. Phys. IV France, 06 C3 (1996) C3-163-C3-167

DOI: https://doi.org/10.1051/jp4:1996325

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This article has been cited by the following article(s):

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Fabrication of mesoscopic superconducting Nb wires using conventional electron-beam lithographic techniques

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Characterization of all-chromium tunnel junctions and single-electron tunneling devices fabricated by direct-writing multilayer technique

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Journal of Applied Physics 86 (12) 6956 (1999)
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