Articles citing this article

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Cited article:

Hot-carrier effects and reliable lifetime prediction in deep submicron N- and P-channel SOI MOSFETs

Shing-Hwa Renn, J.-L. Pelloie and F. Balestra
IEEE Transactions on Electron Devices 45 (11) 2335 (1998)
https://doi.org/10.1109/16.726651

Hot-carrier effects and lifetime prediction in off-state operation of deep submicron SOI N-MOSFETs

Shing-Hwa Renn, E. Rauly, J.-L. Pelloie and F. Balestra
IEEE Transactions on Electron Devices 45 (5) 1140 (1998)
https://doi.org/10.1109/16.669572