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This article has been cited by the following article(s):
Interface failure analysis of embedded NiTi SMA wires using in situ high-resolution X-ray synchrotron tomography
Julia Jungbluth, Stefan Bruns, Catarina Schmidt, Felix Beckmann, Julian Moosmann, Anna Gapeeva, Jürgen Carstensen, Rainer Adelung, Berit Zeller-Plumhoff and Martin Gurka Materials Characterization 205 113345 (2023) https://doi.org/10.1016/j.matchar.2023.113345
Molecular Dynamics Study of Bulk Properties of Polycrystalline NiTi