Articles citing this article

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Cited article:

Optical investigation methods for SiC device development: application to stacking faults diagnostic in active epitaxial layers

J Camassel and S Juillaguet
Journal of Physics D: Applied Physics 40 (20) 6264 (2007)
https://doi.org/10.1088/0022-3727/40/20/S11

A magneto‐optical study of interdiffusion in InGaAs/InP quantum wells: Effects of heat treatment, substrates, and dopants

S. L. Wong, R. J. Nicholas, R. W. Martin, J. Thompson, A. Wood, A. Moseley and N. Carr
Journal of Applied Physics 79 (9) 6826 (1996)
https://doi.org/10.1063/1.361504