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Cited article:

Thermomechanical model of an oxide-confined GaAs-based VCSEL emitter

R.A. Coppeta, R. Fabbro, M. Pusterhofer, T. Haber and G. Fasching
Microelectronics Reliability 140 114828 (2023)
https://doi.org/10.1016/j.microrel.2022.114828

Electrical-stress driven oxidation in 940 nm oxide-confined VCSEL

Michael Pusterhofer, Robert Fabbro, Raffaele A Coppeta, Gernot Fasching and Peter Hadley
Semiconductor Science and Technology 37 (1) 015010 (2022)
https://doi.org/10.1088/1361-6641/ac3c99

Mobility of Partial Dislocations in ZnS and the Cathodoplastic Effect

A. Faress, S. Farenc, C. Levade and G. Vanderschaeve
Physica Status Solidi (a) 137 (2) 435 (1993)
https://doi.org/10.1002/pssa.2211370216