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Cited article:

INFRARED LBIC SCAN MAPS APPLIED TO ALUMINIUM GETTERED MULTICRYSTALLINE SILICON WAFERS

J.Y. NATOLI, M. PASQUINELLI, F. FLORET, S. MARTINUZZI

J. Phys. IV France, 01 C6 (1991) C6-237-C6-238

DOI: https://doi.org/10.1051/jp4:1991637

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This article has been cited by the following article(s):

External gettering by aluminum–silicon alloying observed from carrier recombination at dislocations in float zone silicon wafers

S. Martinuzzi, I. Perichaud and J. J. Simon
Applied Physics Letters 70 (20) 2744 (1997)
https://doi.org/10.1063/1.119009