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Infrared birefringence imaging of residual stress and bulk defects in multicrystalline silicon
Vidya Ganapati, Stephan Schoenfelder, Sergio Castellanos, et al. Journal of Applied Physics 108(6) (2010) https://doi.org/10.1063/1.3468404
Chemical natures and distributions of metal impurities in multicrystalline silicon materials
T. Buonassisi, A. A. Istratov, M. D. Pickett, M. Heuer, J. P. Kalejs, G. Hahn, M. A. Marcus, B. Lai, Z. Cai, S. M. Heald, T. F. Ciszek, R. F. Clark, D. W. Cunningham, A. M. Gabor, R. Jonczyk, S. Narayanan, E. Sauar and E. R. Weber Progress in Photovoltaics: Research and Applications 14(6) 513 (2006) https://doi.org/10.1002/pip.690
Analysis of copper-rich precipitates in silicon: Chemical state, gettering, and impact on multicrystalline silicon solar cell material
Tonio Buonassisi, Matthew A. Marcus, Andrei A. Istratov, et al. Journal of Applied Physics 97(6) 063503 (2005) https://doi.org/10.1063/1.1827913
EBIC and TEM analysis of the electrical activity of Σ = 25 and Σ = 13 silicon bicrystals after thermal treatments