Articles citing this article

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The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

Effects of copper and oxygen precipitation during thermal oxidation of silicon: An electron‐beam‐induced current study

A. Correia, D. Ballutaud, A. Boutry‐Forveille and J.‐L. Maurice
Journal of Applied Physics 78 (11) 6543 (1995)
https://doi.org/10.1063/1.360475

Dislocation–gold interaction in silicon the role of dislocations as sinks for self-interstitials

B. Pichaud, G. Mariani, W. J. Taylor and W.-S. Yang
Physica Status Solidi (a) 138 (2) 465 (1993)
https://doi.org/10.1002/pssa.2211380214