Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

MATERIALS AND INTERFACES CHARACTERIZATION BY MICRO-RAMAN SPECTROSCOPY

P.V. HUONG

J. Phys. IV France, 01 C6 (1991) C6-151-C6-162

DOI: https://doi.org/10.1051/jp4:1991624

PDF (1.036 MB)

This article has been cited by the following article(s):

Polarized off-axis Raman spectroscopy: A technique for measuring stress tensors in semiconductors

G. H. Loechelt, N. G. Cave and J. Menéndez
Journal of Applied Physics 86 (11) 6164 (1999)
https://doi.org/10.1063/1.371670