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Cited article:

MODELLING OF THE ELECTRON-BEAM-INDUCED CURRENT AT A METAL-p-Si SCHOTTKY CONTACT : COMPARISON WITH EXPERIMENT

A. ZOZIME, I. DELIDAIS, Y. MARFAING

J. Phys. IV France, 01 C6 (1991) C6-107-C6-114

DOI: https://doi.org/10.1051/jp4:1991618

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This article has been cited by the following article(s):

Calculation of the electron beam induced current at the interface of a Schottky contact in the presence of Shockley–Read–Hall recombination

Y. Beggah, D.E. Mekki, N. Tabet and R.J. Tarento
Solid-State Electronics 42 (3) 379 (1998)
https://doi.org/10.1016/S0038-1101(97)00213-X