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Cited article:

Spatially-Resolved X-Ray Absorption fine Structure (XAFS) Spectroscopy Using Undulator Radiation Focused by Dynamically-Bent Elliptical Mirrors

S R Sutton, P E Eng, M L Rivers and M Newville
Microscopy and Microanalysis 4 (S2) 364 (1998)
https://doi.org/10.1017/S1431927600021942