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Cited article:

Glancing Angle EXAFS of Ultra Thin Films : Negligible Anomalous Dispersion Effects

D.T. Jiang, E.D. Crozier

J. Phys. IV France, 7 C2 (1997) C2-247-C2-248

DOI: https://doi.org/10.1051/jp4/1997184

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This article has been cited by the following article(s):

InxGa(1−x)As quantum dots grown on GaAs studied by EXAFS in total reflection mode (ReflEXAFS)

F. d’Acapito, S. Colonna, F. Arciprete, et al.
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 200 85 (2003)
https://doi.org/10.1016/S0168-583X(02)01679-8