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Cited article:

A practical method for determining film thickness using X-ray absorption spectroscopy in total electron yield mode

Noritake Isomura, Keiichiro Oh-ishi, Naoko Takahashi and Satoru Kosaka
Journal of Synchrotron Radiation 28 (6) 1820 (2021)
https://doi.org/10.1107/S1600577521009401

NEXAFS Sensitivity to Bond Lengths in Complex Molecular Materials: A Study of Crystalline Saccharides

Adrian Gainar, Joanna S. Stevens, Cherno Jaye, Daniel A. Fischer and Sven L. M. Schroeder
The Journal of Physical Chemistry B 119 (45) 14373 (2015)
https://doi.org/10.1021/acs.jpcb.5b07159

High resolution soft X-ray absorption spectroscopy for the chemical state analysis of Mn

Jun Kawai, Yoshinobu Mizutani, Tetsuro Sugimura, et al.
Spectrochimica Acta Part B: Atomic Spectroscopy 55 (9) 1385 (2000)
https://doi.org/10.1016/S0584-8547(00)00238-X