Angular Dependent XAFS Studies of a MoSi2 Single Crystal
J. Phys. IV France, 7 C2 (1997) C2-495-C2-496
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Structural and electronic property evolution of nickel and nickel silicide thin films on Si(100) from multicore x-ray-absorption fine-structure studies
S. Naftel, I. Coulthard, T. Sham, S. Das and D.-X. XuPhysical Review B 57 (15) 9179 (1998)
https://doi.org/10.1103/PhysRevB.57.9179