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Cited article:

Resonance Effects on the Auger Spectra of Silicon in Porous Silicon

P. Lagarde, M. Pompa, A.M. Flank

J. Phys. IV France, 7 C2 (1997) C2-371-C2-372

DOI: https://doi.org/10.1051/jp4/1997021

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This article has been cited by the following article(s):

Analysis of SiOxCyHz polymeric materials by x-ray absorption spectroscopy: Anomalous behavior of the resonant SiKLL Auger spectra

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Journal of Applied Physics 100 (3) 033706 (2006)
https://doi.org/10.1063/1.2222043

Chemical stability of Sin+ species in SiOx (x<2) thin films

A. Barranco, J. A. Mejı́as, J. P. Espinós, et al.
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 19 (1) 136 (2001)
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