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Characterization of D-T cryogenic layer formation in a Beryllium capsule using X-ray phase contrast imaging

D.S. Montgomery, D.C. Gautier, B.J. Kozioziemski, J.D. Moody, S.C. Evans, J. Pipes, J.D. Sater, D. Stefanescu and P.J. Walsh

J. Phys. IV France, 133 (2006) 869-873

Published online: 16 juin 2006

DOI: 10.1051/jp4:2006133175

D.S. Montgomery

D.C. Gautier

B.J. Kozioziemski

J.D. Moody

S.C. Evans

J. Pipes

J.D. Sater

D. Stefanescu

P.J. Walsh

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Copyright / Publiée par : EDP Sciences