Journal de Physique IV

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Nano-tomography based on hard X-ray microscopy with refractive lenses

C.G. Schroer, J. Meyer, M. Kuhlmann, B. Benner, T.F. Günzler, B. Lengeler, C. Rau, T. Weitkamp, A. Snigirev and I. Snigireva

J. Phys. IV France, 104 (2003) 271

DOI: 10.1051/jp4:200300078

C.G. Schroer

J. Meyer

M. Kuhlmann

B. Benner

T.F. Günzler

B. Lengeler

C. Rau

T. Weitkamp

A. Snigirev

I. Snigireva

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Copyright / Publiée par : EDP Sciences