Journal de Physique IV

Characterisation of complex multilayer structures using spectroscopic ellipsometry

M.I. Alonso, M. Garriga, C. Domínguez and A. Llobera

J. Phys. IV France, 09 PR8 (1999) Pr8-1195-Pr8-1202

DOI: 10.1051/jp4:19998149

M.I. Alonso

M. Garriga

C. Domínguez

A. Llobera

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