Influence of layer interface parameters on dielectric characteristics of BSTO ferroelectric film planar capacitors A.I. Dedyk, S.F. Karmanenko, S. Leppavuori, V.I. Sakharov, A.A. Semenov, I.T. Serenkov, L.T. Ter-Martirosyan, A. Uusimak et F. Wang J. Phys. IV France, 08 PR9 (1998) Pr9-217-Pr9-220 DOI: 10.1051/jp4:1998941