Gamma radiation tolerance of UHV/CVD SiGe BiCMOS technology operated at cryogenic temperatures J.M. Roldán, J.D. Cressler, G. Niu, S.D. Clark et D. Nguyen-Ngoc J. Phys. IV France, 08 PR3 (1998) Pr3-99-Pr3-102 DOI: 10.1051/jp4:1998323