Journal de Physique IV

Gamma radiation tolerance of UHV/CVD SiGe BiCMOS technology operated at cryogenic temperatures

J.M. Roldán, J.D. Cressler, G. Niu, S.D. Clark and D. Nguyen-Ngoc

J. Phys. IV France, 08 PR3 (1998) Pr3-99-Pr3-102

DOI: 10.1051/jp4:1998323

J.M. Roldán

J.D. Cressler

G. Niu

S.D. Clark

D. Nguyen-Ngoc

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