The electrical assessment of Si1-xGex/Si heterostructures V.S. Lysenko, I.P. Tyagulski, Y.V. Gomeniuk, I.N. Osiyuk, C.J. Patel, O. Nur et M. Willander J. Phys. IV France, 08 PR3 (1998) Pr3-87-Pr3-90 DOI: 10.1051/jp4:1998320