Journal de Physique IV

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Structural Characterization of Thin Films and Multilayer Structures

K. Temst, M.J. Van Bael, M. Baert, E. Rosseel, V. Bruyndoncx, C. Strunk, G. Verbanck, K. Mae, C. Van Haesendonck, V.V. Moshchalkov et al. (5 more)

J. Phys. IV France, 06 C3 (1996) C3-265-C3-270

DOI: 10.1051/jp4:1996340

K. Temst

M.J. Van Bael

M. Baert

E. Rosseel

V. Bruyndoncx

C. Strunk

G. Verbanck

K. Mae

C. Van Haesendonck

V.V. Moshchalkov

Y. Bruynseraede

R. Jonckheere

D.G. de Groot

N. Koeman

R. Griessen

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Copyright / Publiée par : EDP Sciences