Journal de Physique IV

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Characterization of roughness correlations in W/Si multilayers by diffuse x-ray scattering

T. Salditt, T.H. Metzger and J. Peisl

J. Phys. IV France, 04 C9 (1994) C9-171-C9-174

DOI: 10.1051/jp4:1994928

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