Investigation of laser-induced damage at 248 nm in oxide thin films with a pulsed photoacoustic mirage technique J. Siegel, M. Reichling, E. Matthias, E. Hacker et H. Lauth J. Phys. IV France, 04 C7 (1994) C7-745-C7-748 DOI: 10.1051/jp4:19947175