Journal de Physique IV

Use of image treatment for the understanding of the influence of crystal defects in piezoelectric materials

M. PILARD, Y. EPELBOIN, B. CAPELLE, J. DETAINT, J. SCHWARTZEL and A. ZARKA

J. Phys. IV France, 04 C2 (1994) C2-53-C2-60

DOI: 10.1051/jp4:1994207

M. PILARD

Y. EPELBOIN

B. CAPELLE

J. DETAINT

J. SCHWARTZEL

A. ZARKA

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