Journal de Physique IV

Characterizing faulted dipoles in TiAl with electron microscopy and computed image simulations

B. VIGUIER, K.J. HEMKER, R. SCHÄUBLIN and J.L. MARTIN

J. Phys. IV France, 03 C7 (1993) C7-441-C7-444

DOI: 10.1051/jp4:1993768

B. VIGUIER

K.J. HEMKER

R. SCHÄUBLIN

J.L. MARTIN

Articles written by ALL the selected authors (AND)

Articles written by ANY OF the selected authors (OR)