Journal de Physique IV

Characterization of SiO₂ films grown on Si substrates by monoenergetic positron beams

A. UEDONO, L. WEI, S. TANIGAWA, R. SUZUKI, H. OHGAKI and T. MIKADO

J. Phys. IV France, 03 C4 (1993) C4-177-C4-183

DOI: 10.1051/jp4:1993424

A. UEDONO

L. WEI

S. TANIGAWA

R. SUZUKI

H. OHGAKI

T. MIKADO

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