Journal de Physique IV

An lntegrated Growth and Analysis System for In-Situ XAS Studies of Metal- Semiconductor Interactions

Z. Wang, P. T. Goeller, B. I. Boyanov, D. E. Sayers and R. J. Nemanich

J. Phys. IV France, 7 C2 (1997) C2-561-C2-564

DOI: 10.1051/jp4/1997096

Z. Wang

P. T. Goeller

B. I. Boyanov

D. E. Sayers

R. J. Nemanich

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