Angular Dependent XAFS Studies of a MoSi2 Single Crystal S.J. Naftel, T.K. Sham, V.L. Smelyansky, J.S. Tse et J.D. Garrett J. Phys. IV France, 7 C2 (1997) C2-495-C2-496 DOI: 10.1051/jp4/1997065
