HREM Characterization of Interfaces in Thin MOCVD Superconducting Films D. Dorignac, S. Schamm, Ch. Grigis, J. Santiso, G. Garcia et A. FiguerasJ. Phys. IV France, 05 C5 (1995) C5-927-C5-934DOI: https://doi.org/10.1051/jphyscol:19955110
