Cryogenic detector systems for materials analysis
J. Höhne, M. Bühler, F.V. Feilitzsch, J. Jochum, T. Hertrich, C. Hollerith, M. Huber, J. Nicolosi, K. Phelan, D. Redfern, B. Simmnacher, R. Weiland et D. Wernicke
J. Phys. IV France, 12 3 (2002) 127-128
DOI: https://doi.org/10.1051/jp420020050
